A-b wafer probe

peculiarity

Low resistance four-wire probes are widely used in ultra-low resistance manual and automatic measuring instruments, with accurate measurement, height adjustment, and low impedance characteristics. Low resistance test probe can be based on customer requirements, electroplating different external metal (gold, silver, copper, titanium, etc.) materials to meet the needs of different industries. The blade probe can be a minimum diameter of 8um, and various shapes of blade probes can be customized according to the needs of different customers. The knife needle has the characteristics of easy installation and maintenance, and customers can assemble according to their own products.

The blade probe has easy installation, and customers can make small Pad pin cards by themselves, which has reduced production costs and failures.

Low resistance probe: Height adjustable ≤1.8mm

Low impedance characteristic :≤1mQ

Blade probe: heat-treated beryllium copper gold plated with high current 1-5A

Low impedance characteristic :≤10mQ